Nathan Iyer
(408) 727-0002
IC Design:
RF blocks(LNA, PA, Mixer,
Switches)
Mixed-Signal (DAC, ADC, OpAmps,
Bandgaps, integer/Frac-N PLL)
Digital Circuitry (Filter,
Receiver Algorithms, State-Machines, Serial Interfaces, Encoders, Decoders
using Verilog HDL )
IC Layout and Verification
Top- down design verification
approach for large mixed signal ICs using functional models.
Board Design:
Reference Board Design, Software
and Drivers.
Generating Signal
Integrity IBIS models from SPICE Simulations.
Design verification and testing
for RFID reader chip. Designed serial port, RFID Gen2 Decoder and FIFO,
successfull real time FPGA verification, taped out ASIC version.
802.11 RF Blocks, Integer PLLs,
Frac-N PLLs, DACs, LNAs, Mixers, PA Drivers, VCOs, Digital Filters.
RF Medical Devices.
IBIS Models.
Master of Science in
Electrical Engineering,
Florida Atlantic University, Boca Raton, Florida
Bachelor’s degree in Electronics
And Communications Engineering Institution of Engineers, India.
IC Design
Software:
Agilent ADS (Linear/Nonlinear/Ptolemny)
Cadence DFII : Analog/RF Design Environment,
Agilent RFDE and Dynamic Link
Math programs and
system simulator programs:
Matlab/Simulink
Xilinx System Generator
Synplify DSP
Digital design
and verification programs:
Xilinx ISE
ModelSim
Layout Programs:
Cadence Virtuoso Layout Editor (IC Layout)
Cadsoft Eagle Layout Editor (Board Layout)
HDL
Languages:
Verilog
VerilogA
Programming
Languages:
Matlab
C/C++
US Patent:6285239, July 2000, Feed-Forward Biasing for RF Amplifiers II.
Microwave Journal, February 2000, A PA Driver for Split-Band Application.
RF Design magazine, June 1999, Improve efficiency of RF Power Amplifiers.
US Patent:6130579, March 1999, Feed-Forward Biasing for RF Amplifiers I.
US Patent:5723001, March 1998, Apparatus and method for therapeutically treating
human body tissue with electromagnetic radiation.
RF Design magazine, February 1997, Custom Control Software Tool for Smith charts.
A
Titanium-dioxide Based Ceramic Composite Dispersed with Conducting
Inclusions as an EMI Shielding Material, Proc. 1993 IEEE International
Symposium EMC, August 9-13, 1993, Dallas, Texas.